[ Identification | Description | Input parameters | Links ]

The Test_Incoherent_MS Instrument

Test instrument for validation of magnitude of multiple scattering in Incoherent.comp.

Identification

Description

Test instrument for validation of magnitude of multiple scattering in Incoherent.comp.
The instrument considers "thin" and "thick" sample conditions.


For the thin sample conditions, the following analytical calulations find the
Neutron intensity at the detector to be 27.12:
$$ \frac{dN_{\rm real}}{dt}= \Psi A \rho_{\rm c}\sigma_{\rm inc} \frac{\Delta \Omega}{4 \pi} a_{\rm lin} l_{unscattered}. $$ Where $\Psi=1e7$, $A=1$, $\rho=0.0723$, $\sigma_{\rm inc}=\sigma_{\rm abs} = 5.08$, $\frac{\Delta \Omega}{4 \pi} = 10/99.95^2$ and $a_{\rm lin}= \exp(-(\sigma_{\rm inc} + \sigma_{\rm abs}\lambda/1.7982)\rho l_{avg})$. $l_{unscattered}=0.1cm$ and is the path through the sample eg. unscattered path length.
For the thick sample condition, the general formula is the same, But the attenuation is calculated using the effective length, instead of the actual length:
\begin{equation} \label{eq:inc_layer_l} l_{\rm app} = \int _{0}^{l_{\rm max}} a_{\rm lin}(z) dz = \int _{0}^{l_{\rm max}} e^{-2\mu z}dz = \frac{1-e^{-2\mu l_{\rm max}}}{2\mu }, \end{equation}
By scanning across thickness values, one then finds a curve, that should fit the analytical calculations.

Input parameters

Parameters in boldface are required; the others are optional.
NameUnitDescriptionDefault
flux_mult1/(s*cm**2*st*meV)Source flux x 1e14 multiplier for source0.5512
thickmSample thickness0.001
total_scattering1Flag to indicate if sample focuses (=0) or not (=1)0
samplestrSample state "thick", "thin", "none" supported"thin"
order1Maximal order of multiple scattering1

Links


[ Identification | Description | Input parameters | Links ]

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