[ Identification | Description | Input parameters | Links ]
Test_Incoherent_MS
InstrumentTest instrument for validation of magnitude of multiple scattering in Incoherent.comp. The instrument considers "thin" and "thick" sample conditions. For the thin sample conditions, the following analytical calulations find the Neutron intensity at the detector to be 27.12:$$ \frac{dN_{\rm real}}{dt}= \Psi A \rho_{\rm c}\sigma_{\rm inc} \frac{\Delta \Omega}{4 \pi} a_{\rm lin} l_{unscattered}. $$ Where $\Psi=1e7$, $A=1$, $\rho=0.0723$, $\sigma_{\rm inc}=\sigma_{\rm abs} = 5.08$, $\frac{\Delta \Omega}{4 \pi} = 10/99.95^2$ and $a_{\rm lin}= \exp(-(\sigma_{\rm inc} + \sigma_{\rm abs}\lambda/1.7982)\rho l_{avg})$. $l_{unscattered}=0.1cm$ and is the path through the sample eg. unscattered path length.For the thick sample condition, the general formula is the same, But the attenuation is calculated using the effective length, instead of the actual length:\begin{equation} \label{eq:inc_layer_l} l_{\rm app} = \int _{0}^{l_{\rm max}} a_{\rm lin}(z) dz = \int _{0}^{l_{\rm max}} e^{-2\mu z}dz = \frac{1-e^{-2\mu l_{\rm max}}}{2\mu }, \end{equation}By scanning across thickness values, one then finds a curve, that should fit the analytical calculations.
Name | Unit | Description | Default |
flux_mult | 1/(s*cm**2*st*meV) | Source flux x 1e14 multiplier for source | 0.5512 |
thick | m | Sample thickness | 0.001 |
total_scattering | 1 | Flag to indicate if sample focuses (=0) or not (=1) | 0 |
sample | str | Sample state "thick", "thin", "none" supported | "thin" |
order | 1 | Maximal order of multiple scattering | 1 |
Test_Incoherent_MS.instr
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[ Identification | Description | Input parameters | Links ]
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