[ Identification | Description | Input parameters | Links ]

The ISIS_CRISP Instrument

Model of the ISIS CRISP reflectometer, including the Multilayer_Sample reflectivity sample.

Identification

• Site: ISIS
• Author: Robert Dalgliesh
• Origin: ISIS (UK)
• Date: 2010

Description

This model of the ISIS CRISP reflectometer demonstrates the use of the Multilayer_Sample component.

The algorithm of the component requires complex numbers, facilitated by the
GNU Scientific Library (GSL). To link
your the instrument with an installed GSL, you should use MCSTAS_CFLAGS like

MCSTAS_CFLAGS = -g -O2 -lm -lgsl -lgslcblas

Input parameters

Parameters in boldface are required; the others are optional.

Name	Unit	Description	Default
glen	m	Length of the elliptical guides	1.4
flen	m	Focal-length of elliptical guides	0.4
w1	m	Entry-width of elliptical guides	0.05
vm	m	m-value of material for left and right vertical guide mirrors	3.0
FRAC	1	Fraction of statistics used to model incoherent scattering from sample	0

Links

• Source code for ISIS_CRISP.instr.
• Website of the CRISP instrument

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[ Identification | Description | Input parameters | Links ]

Generated on 2025-05-08 13:31:31

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Last Modified: Monday, 30-Jun-2025 11:05:10 CEST