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About McStas Download Documentation |
[ Identification | Description | Input parameters | Links ] The
|
Name | Unit | Description | Default | |
xwidth | m | Width of sample volume | 0.05 | |
yheight | m | Height of sample volume | 0.15 | |
zsapph | m | Thickness of the sapphire layer on one side | 0.02 | |
zsamp | m | Thickness of the overall sample between sapphire and silicon | 0.002 | |
zsampsurf | m | Thickness from the total of zsamp on either side of sapphire/silicon that is oriented | 0.000001 | |
zsilicon | m | Thickness of the silicon layer on the other side | 0.02 | |
zsiliconsurf | m | Thickness from the total of zsilicon on the sample side (oxidization layer) | 5e-9 | |
rhosapph | 5.773e-6 | |||
abslensapph | 163.708 | |||
inclensapph | 49.815 | |||
rhoD2O | 6.364e-6 | |||
abslenD2O | 44066.347 | |||
inclenD2O | 7.258 | |||
rhoPS | 1.358e-6 | |||
abslenPS | 114.502 | |||
inclenPS | 0.24588 | |||
rhosiliconsurf | 4.123e-6 | |||
abslensiliconsurf | 401.051 | |||
inclensiliconsurf | 169.11 | |||
rhosilicon | 2.079e-6 | |||
abslensilicon | 209.919 | |||
inclensilicon | 9901.6 | |||
phiPS | 1 | Concentration vol/vol of colloids in D2O | 0.1 | |
Rad | A | Radius of colloids in Aangstroem | 370.0 | |
phirot | rad | angle of the ordered (aligned) crytallites at the two surfaces towards sapphire/silicon | 0.0 | |
sc_aim | 1 | how much is scattered versus transmitted | 0.98 | |
sans_aim | 1 | how much goes to the small angle range versus wide angles | 0.98 |
AT ( | , | , | ) RELATIVE | |||
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ROTATED ( | , | , | ) RELATIVE |
GISANS_sample.comp
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[ Identification | Description | Input parameters | Links ]
Generated on mcstas 3.5.24